ir. R.L. Leijsen

Guest
Circuits and Systems (CAS), Department of Microelectronics

Expertise: Electical Properties Tomography using MRI

Themes: Biomedical signal processing/wavefield imaging

Biography

Reijer Leijsen is a PhD student at LUMC, working part-time in the CAS group with Rob Remis. He obtained the MSc (ir.) degree in 2016 from TU Delft at CAS.

Publications

  1. Developments in Electrical Properties Tomography Based on the Contrast-Source Inversion Method
    R. Leijsen; P. Fuchs; W. Brink; A. Webb; Rob Remis;
    Journal of Imaging,
    Volume 5, 2019. DOI: 10.3390/jimaging5020025
    document

  2. Limitations of 2D Field Structure Assumptions in Electrical Properties Tomography and its 3D CSI-EPT Solution
    P. Fuchs; R. Leijsen; R. Remis;
    In IMEP 2019: Second International Workshop on MR-Based Electrical Properties Tomography (proceedings),
    Utrecht (The Netherlands), pp. 48-49, March 2019.
    document

  3. Sensitivity of 3D CSI-EPT Reconstructions to Modelled EM Field Variations and Object Truncation
    R. Leijsen; W. Brink; R. Remis; A. Webb;
    In IMEP 2019: Second International Workshop on MR-Based Electrical Properties Tomography (proceedings),
    Utrecht (The Netherlands), pp. 74-75, March 2019.
    document

  4. Improving Tissue Electrical Properties Reconstructions by Exploiting the Benefits of Combining Deep Learning-EPT and 3D Contrast Source Inversion-EPT
    R. Leijsen; C.A.T. van den Berg; R. Remis; A. Webb; S. Mandija;
    In ISMRM 2019: The 27th Annual Meeting of the ISMRM (book of abstracts),
    Montreal (Canada), pp. 5050, May 2019.
    document

  5. Limitations of 2-D Field Structure Assumptions in Electrical Properties Tomography and its 3-D CSI-EPT Solution
    P. Fuchs; R. Leijsen; R. Remis;
    In ISMRM 2019: The 27th Annual Meeting of the ISMRM (book of abstracts),
    Montreal (Canada), pp. 5054, May 2019.
    document

  6. 3-D Contrast Source Inversion-Electrical Properties Tomography
    R. L. Leijsen; W. M. Brink; C. A. T. van den Berg; A. G. Webb; R. F. Remis;
    IEEE Transactions on Medical Imaging,
    Volume 37, Issue 9, pp. 2080-2089, September 2018. ISSN: 0278-0062. DOI: 10.1109/TMI.2018.2816125
    document

  7. 3D CSI-Electrical Properties Tomography
    R. Leijsen; W. Brink; C. van den Berg; A. Webb; R. Remis;
    In ISMRM18 – International Society for Magnetic Resonance in Medicine 26th Annual Meeting and Exhibition,
    Paris (France), June 2018.
    document

  8. Electrical properties tomography using contrast source inversion techniques
    R. F. Remis; A. W. S. Mandija; R. L. Leijsen; P. S. Fuchs; P. R. S. Stijnman; C. A. T. van den Berg;
    In 2017 International Conference on Electromagnetics in Advanced Applications (ICEAA),
    (Verona, Italy), pp. 1025-1028, September 2017. DOI: 10.1109/ICEAA.2017.8065434
    document

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Last updated: 20 Jul 2017